摘要
利用ZeCl准分子激光在(100)Si基片上原位淀积出ZrO_2缓冲层和YBa_2Cu_3O_(7-x)高T_c超导薄膜,薄膜的零电阻温度为82K.X射线衍射结果表明该超导薄膜具有很强的c轴取向的正交结构。
High T_c superconducting thin film of YBa_2Cu_3O_(7-x) and Zro_2 buffer layer have been de-posited in situ on(100)silicon substrate with excimer laser.The zero-resistance tempera-ture of the film is T_(c0)=88 K. The X-ray diffraction pattern of the film indicates that the film is of orthorhombic phase structure with strong orientation of c-axis perpendicular to the film surface,Deposition of multi-layer film in the same vacuum chamber with excimer laser has alsobeen achieved.
出处
《华中科技大学学报(自然科学版)》
EI
CAS
CSCD
北大核心
1995年第S2期115-117,共3页
Journal of Huazhong University of Science and Technology(Natural Science Edition)
基金
国家教委基金
关键词
准分子激光
原位淀积
超导薄膜
Si基片
excimer laser
Si-substrate
superconducting thin film
in situ deposition