摘要
电镜故障是多方面的.本文就日本JEM—100CX电镜电子束偏转系统的一例故障进行分析及排除,供电镜同行参考.
The authors analysed the trouble of the beam deflector in JEM 100CXTEM and summarized the better method for correcting it.This may provide a useful wayfor engineers in maintaining this type of electron microscope.
出处
《云南大学学报(自然科学版)》
CAS
CSCD
1995年第S1期95-97,共3页
Journal of Yunnan University(Natural Sciences Edition)