摘要
本文叙述了一种新型三维物体表面测量方论，该方法利用单光栅投射待测物体表面而获取变形光栅象，然后应用图象处理方法，通过微机计算出物体表面各点高度．该方法测试精度高，速度快．文中对其原理进行了详细的叙述，并讨论了该法的测量范围、灵敏度．
his paper describes a new measuring method of 3-D object surface profile. This deformed grating with phase modulation caused by the profile of the object under test is sampled by a CCD camera. The phase related to the profile can be determined through the shift of the digital reference grating generated by computer. The principle of the mesuring and the detail of image processiing are given. The ranges of mesurement and the sensitivity of the method are also discussed.
出处
《合肥工业大学学报（自然科学版）》
CAS
CSCD
1995年第S1期85-88,共4页
Journal of Hefei University of Technology：Natural Science
关键词
光栅
模尔拓扑
图象处理
rofilemetrty
moire topography
3-D measurement
