角分布俄歇显微术──俄歇电子能谱的新进展

Angular Distribution Auger Microscopy──a New Development in Auger Electron Spectroscopy

综述了俄歇电子能谱的新进展──角分布俄歇显微术。测量和展示俄歇电子的全角分布可给出浅表面原子的影象，借此可对样品表面原子、分子结构进行表征。理论认为这种原子形象是浅表面原子受较深层原子发射俄歇电子映照而成的，以Ｐｔ、Ｉ２为例，用相应理论教学模式模拟，所得结果和实验结果极相符合。角分布俄歇显微术在实践和理论上将俄歇电子能谱向前推进了一步。

Angular distribution Auger microscopy is reviewed as a new develepment in Auger electron spectroscopy. Measurements and display of the complete angular distributionof Auger electrons give rise to the image of near-surface atoms,which afford a technique for the characterization of the atom, molecular structure of surfaces of the samples. A theory is put forward accordingly to explain the formation of the image with the 'reflection' mechanism of near-surface atoms by Auger emission from atoms deeper in solid. Theoretical simulations of Auger electron angular distributions are in close agreement with experimental results, as illustrated by taking Pt and I as examples. The establishment of angular distribution Auger microscopy has been a great contribution to Auger electron spectroscopy.