摘要
Si segregation was observed in the vacancy condensation pits,formed by supersaturated vacancies beneath the oxidation layer of Al-0.35wt-%Si alloy,by optical microscopy,X- ray photoelectron spectroscopy and microhardness tests.This phenomenon could only be explained by vacancy-Si complex inducing non-equilibrium segregation.
Si segregation was observed in the vacancy condensation pits,formed by supersaturated vacancies beneath the oxidation layer of Al-0.35wt-%Si alloy,by optical microscopy,X- ray photoelectron spectroscopy and microhardness tests.This phenomenon could only be explained by vacancy-Si complex inducing non-equilibrium segregation.