摘要
对多层蒸镀经高温退火制备的T_c≥83K的超导薄膜进行了XRD及EPMA研究。结果表明:超导薄膜是具有较强c轴织构的多晶膜,晶粒度约为3μm,膜层中存在微孔与微隙,滑移线痕与孪晶以及第二相等结构缺陷,文章从结晶学原理、经典的晶体范性形变的研究以及正交晶系滑移系的特点出发对几种缺陷的形成机理和缺陷对超导性能的影响进行了初步分析.
The superconducting fims,With Tc≥ = 83 K,prepared by using multilayer electron beam deposition technique and post-annealed at high temperature,were researched using XRD and EPMA.The results shown that the superconducting films were polycrystalline with stronger c-axis texture.The grain size of the films was about 3 μm,and the microholes,microcracks,slip bands, microtwins and secondary phases were existed in the films. The mechanism of the defect formation and the effects of defects to super-conducting properties are discussed according to the theory of crystallography and clasical theory of plastic deformation of crystals and the characteristics of slip system of orthogonal crystals.
出处
《云南大学学报(自然科学版)》
CAS
CSCD
1993年第S2期12-17,共6页
Journal of Yunnan University(Natural Sciences Edition)
关键词
超导薄膜
结构
形貌
superconducting film, structure, morphology.