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由氨解法制备的Si_3N_4粉末的表面元素状态

Surface State of Fine Si3N4 Powders Made from Thermal Decomposition of SilicOn-Imide
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摘要 用XPS表面分析,研究了由氨解法在不同温度下热解所得的Si_3N_4粉末,并与由硅粉氮化所得的商用Si_3N_4粉末作了比较。由氨解法制备的Si_3N_4粉末其表面存在两种状态的氧:结合状态的氧和吸附态的氧,其表面组成为Si_(2.2-2.7)N_(2.9-3.7)O。由硅粉氮化所制得Si_3N_4其表面也存在两种状态的氧,其表面组成则为Si_(0.8)N_(0.8)O。 Si3N4 powders made from imide process and thermal decomposed at different temperatures have investigated by XPS surface analysis; They were compared with a commercial Si3N4 powder made with nitridation process. Oxygen both in combined form of Si2.2-2.7N2.9_3.7O layer and absorbed form were found on the powder surface, in contrast to Si0.8 N0.8O layer and absorbed form in the case of Si3N4 powders made from Si aitridation.
出处 《北京科技大学学报》 EI CAS CSCD 北大核心 1991年第S2期1-6,共6页 Journal of University of Science and Technology Beijing
关键词 表面光电子能谱分析 氮化硅 粉末 热分解 XPS, Si3N4, powder, thermal decomposition
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