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POLYMER DIODES MADE OF ION IMPLANTED POLYACETYLENE FILMS

POLYMER DIODES MADE OF ION IMPLANTED POLYACETYLENE FILMS
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摘要 Polyacetylene films were doped with FeCl3 and implanted with 30 k’eV K+ ions. Physical changes to the films were examined by a series of measurements, which include the four-probe test, infrared ray absorption and 2 MeV He+ particle elastic recoil dettection and Rutherford backscattering. The chemical dopants (Fe+++ and Cl-) were redistributed after the implantation and the different species (K+. Fe+++ and Cl-ions) formed p - n junctions at the implantation depths. The implanted films exhibited desirable Ⅰ-Ⅴ characteristics, with current densities as high as 600 mA/cm- at 3V and back - to - forward ratio of current over 300. The polymer diodes kept their behavior for over 60 days. Discussions on the results were given in detail. Polyacetylene films were doped with FeCl3 and implanted with 30 k'eV K+ ions. Physical changes to the films were examined by a series of measurements, which include the four-probe test, infrared ray absorption and 2 MeV He+ particle elastic recoil dettection and Rutherford backscattering. The chemical dopants (Fe+++ and Cl-) were redistributed after the implantation and the different species (K+. Fe+++ and Cl-ions) formed p - n junctions at the implantation depths. The implanted films exhibited desirable Ⅰ-Ⅴ characteristics, with current densities as high as 600 mA/cm- at 3V and back - to - forward ratio of current over 300. The polymer diodes kept their behavior for over 60 days. Discussions on the results were given in detail.
出处 《Nuclear Science and Techniques》 SCIE CAS CSCD 1990年第4期193-197,共5页 核技术(英文)
基金 The Project Supported by National Natural Science Foundation of China, Contract No.1860193
关键词 ION IMPLANTATION DOPANT depth profiling POLYACETYLENE DIODES Ion implantation Dopant depth profiling Polyacetylene diodes
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