摘要
High energy ion backscattering can be used to enhance the sensitivity of oxygen analysis. At He++ ion energy of 8.8 MeV, the yield due to oxygen is about 25 times larger than that predicted by Rutherford formula. The elemental stoichiometry of some bulk and thin film superconductor samples was determined. The details of the measuring method are discribed.
High energy ion backscattering can be used to enhance the sensitivity of oxygen analysis. At He++ ion energy of 8.8 MeV, the yield due to oxygen is about 25 times larger than that predicted by Rutherford formula. The elemental stoichiometry of some bulk and thin film superconductor samples was determined. The details of the measuring method are discribed.
