摘要
In view of K-fault testability,the topological construction of a practical circuitis far from ideal.In order to improve the testability of a circuit,we may increase the numberof accessible nodes or use the multi-excitation method.Effectiveness of these methods and thefeasibility of choosing accessible nodes are discussed in detail.The conditions for multi-excitationtestability are presented.
In view of K-fault testability,the topological construction of a practical circuit is far from ideal.In order to improve the testability of a circuit,we may increase the number of accessible nodes or use the multi-excitation method.Effectiveness of these methods and the feasibility of choosing accessible nodes are discussed in detail.The conditions for multi-excitation testability are presented.
基金
The work was supported by National Science Foundation of China.
