摘要
理论研究导出了用微分功率输出监控半导体激光器端面减反射膜制备的主动监控法的两条原则。遵循这两原则完成了减反射膜的镀制,显著提高了主动监控法的可靠性。
Two principles have been proposed for the active monitoring method, adopted to the AR Coating semiconductor lasers and based on detecting the derivatives of the outputs from the facets to be coated. The principles have been used to guide the AR coating experiments and to improve the reliability of the experiments.
出处
《真空科学与技术学报》
EI
CAS
CSCD
1990年第4期261-264,222,共5页
Chinese Journal of Vacuum Science and Technology
基金
国家自然科学基金
教委博士点基金