神光-Ⅱ激光装置上的针孔点背光成像技术实验研究

Experimental research on pinhole-assisted point-projection backlighting on Shenguang-Ⅱ laser facility

在神光-Ⅱ激光器上开展了针孔点背光成像技术实验研究,利用第9路激光驱动平面钛靶获得4.75keV的准单能光源,在10μm的针孔约束下形成次级点光源对镍网格等样品成像。实验获取了清晰的网格图像,空间分辨力达到7μm,并对烧蚀碎片、杂散光等该技术的关键性问题进行了系统深入的研究分析。实验结果表明:针孔点背光具有高空间分辨力、大视场等特点,优于传统背光技术。

The research on pinhole-assisted point-projection backlighting has been performed on Shanghai Shenguang-Ⅱ laser facility.The point-like X-ray source at 4.75 keV was produced from 200 J/200 ps/351 nm backlighting laser interaction with 10 μm thick Ti target.And the clear gridding image with a spatial resolution of 7 μm was obtained.Key issues in improving signal-to-noise ratio and preventing blasting debris were analyzed.The pinhole-assisted point-projection backlighting shows advantages over tranditional backlighting techniques,such as high spatial resolution,large view field.