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Thermal Warpage Measurement of Electronic Packages by Shadow Moiré with Phase Stepping Technique

Thermal Warpage Measurement of Electronic Packages by Shadow Moiré with Phase Stepping Technique
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摘要 Phase-stepping technique is applied to the analysis of fringe patterns of shadow moiré of electronic packages.Sensitivity of the fringe pattern analysis is demonstrated to be significantly increased.Thermally induced warpage of electronic packages is successfully measured in real-time as the sample is driven through a simulated reflow process.The paper discusses the technique of phase stepping,noise filtering and its application to the shadow moiré method.Applications of the technology are presented. Phase-stepping technique is applied to the analysis of fringe patterns of shadow moirfi of electronic packages. Sensitivity of the fringe pattern analysis is demonstrated to be significantly increased. Thermally induced warpage of electronic packages is successfully meastlred in real-time as the sample is driven through a simulated reflow process. The paper discusses the technique of phase stepping, noise filtering and its application to the shadow moire method. Applications of the technology are presented.
作者 王银燕
出处 《实验力学》 CSCD 北大核心 2011年第5期556-564,共9页 Journal of Experimental Mechanics
关键词 英文摘要 内容介绍 编辑工作 期刊 shadow moire, printed circuit hoard warpage, electronic packages, fringe patternanalysis, phase stepping
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参考文献11

  • 1Sullivan J L. Phase Stepped Fraction Moir6[J]. Experimental Mechanics, 1991, 31:373-381.
  • 2Wang Y, Hassell P. Measurement of Thermal Deformation of BGA Using Phase-shifting Shadow Moir6[J]. Electronic/Numerical Mechanics in Electronic Packaging, Volume II, p32-39, Society for Experimental Mechanics, Inc. 1998.
  • 3Kreis T. Digital Holographic Interference-phase Measurement Using the Fourier-transform Method[J]. J. opt. Soc. Am. A, 1986, 3(6): 847-855.
  • 4Post D, Han B, Ifju P. High Sensitivity Moire[J]. Springer-Verlag, New York, 1994.
  • 5Creath K. Phase-Measurement Interferometry Techniques[M]. Chap. 5, Progress in Optics, Vol. 26, Elsevier Science Publishers B. V. , 1988.
  • 6Greivenkamp J E. Generalized Data Reduction for Heterodyne Interferometry[J]. Optical Engineering, 1984, 23 (4) : 350-352.
  • 7Morgan C J. Least-Squares Estimation in Phase-Measurement Interferometry[J]. Optics Letters, 1982, 7(8): 368 -370.
  • 8Cheng Y Y, Wyant J C. Phase Shifter Calibration in Phase-shifting Interferometry[J]. Applied Optics, 1985, 24 (18) : 3049-3052.
  • 9Stiteler M, Ume C. System for Real-Time Measurements of Thermally Induced Warpage in a Simulated Infrared Soldering Environment[J]. ASME Journal of Electronic Packaging, 1997, 119:1-7.
  • 10Chang M, Ho C S. Phase-measuring Profilometry Using Sinusoidal Grating[J]. Experimental Mechanics, 1993, 33: 117-122.

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