新型的嵌入式存储器测试算法

Improved Test Algorithms of Embedded Memory

针对目前嵌入式存储器测试算法的测试效率与故障覆盖率难以兼得的现状,提出了兼顾二者的测试算法。实验结果表明该算法最适合对存储器进行大批量的测试。在测试效率上的优势很明显,故障覆盖率也能达到应用标准。

Based on the current situation that the test efficiency and fault coverage of embedded memory test are contradictory, the bal- anced test algorithms are presented. Experimental results show that the algorithms are suitable for memory test. Its advantages on test efficiency is clear. The fault coverage also meets the applicable standards.