摘要
TeOx-SiO2 composite films having third-order nonlinearities were prepared by electrochemically induced sol-gel deposition method on ITO substrate.The third-order optical nonlinearities of the films were measured by Z-scan technique.The third-order nonlinear susceptibilities（χ^（（3））） of the as-prepared films are 5.9×10^（-7） to 4.29×10^（-6）esu.The surface morphology and composition of the films were characterized by SEM/EDX,which identified that Te metallic particles well dispersed in TeO_x-SiO_2 gel films.
TeOx-SiO2 composite films having third-order nonlinearities were prepared by electrochemically induced sol-gel deposition method on ITO substrate.The third-order optical nonlinearities of the films were measured by Z-scan technique.The third-order nonlinear susceptibilities（χ^（（3））） of the as-prepared films are 5.9×10^（-7） to 4.29×10^（-6）esu.The surface morphology and composition of the films were characterized by SEM/EDX,which identified that Te metallic particles well dispersed in TeO_x-SiO_2 gel films.
基金
supported by Academic Program of Natural Science Foundation Project of CQ CSTC(No 2008BC4003)
the Foundation of State Key Laboratory of Physical Chemistry of Solid Surfaces of Xiamen University(No2007)
