摘要
本文针对VLSI宏单元阵列布局的特点讨论了一般模拟退火算法.在开发专用芯片仿真系统中提出的布局布线程序里,使用了低温段模拟退火和高温段启发式算法相结合的改进的SA算法。
In this paper, to aim directly at the character of VLSI cell array placement, a common simulated annealing algorithm is discussed, and especially a low temperature SA algorithm applied to placement program developed in ASIC simulated system have been proposed. It can improve the quality of the placement.$$$$
出处
《南开大学学报（自然科学版）》
CAS
CSCD
北大核心
1999年第4期94-96,106,共4页
Acta Scientiarum Naturalium Universitatis Nankaiensis
基金
天津科委青年基金!(96 370 0 51 1 )资助项目
关键词
模拟退火算法
组合优化
布局布线
VLSI
simulated annealing algorithm
combinational optimization
VLSI placement
