摘要
本文简述了微波暗室的用途及其检定的意义,介绍了常用衡量微波暗室电性能的指标定义,重点讨论了反射电平的测试原理及方法,并对不同的方法做下比较。用空间驻波比法的测量理论实测了一个微波暗室的反射电平,对数据的处理、结果分析以及存在问题做了较详细的介绍,最后提出了几个需要解决的问题。
This paper states briefly the use of mierowave anechoic chamber and the importance of evaluation. The definition of electric specifications used to measure the anechoic chamber are generally intro- duced. It mainly discusses the test principle and methods about reflecting level, and compares the varieties of measurement way. The reflection levels of a practical enechoic chamber were measured with the method of space voltage SWR. Processing data, analizing result and finding faults are introduced in detail. Finally, several problems that need to be solved are proposed. Subject terms Reflection level, Standing wave measurement, Mea- surement method
出处
《宇航计测技术》
CSCD
北大核心
1990年第3期24-31,共8页
Journal of Astronautic Metrology and Measurement