摘要
高速A/D变换的性能主要取决于其动态特性;这种动态特性不能用静态特性替代或推论。随着近年来高速A/D的迅速发展(采样率高达数百兆赫的A/D也已进入市场),如何测试高速A/D的动态特性,已成为当务之急。本文提出一个高速A/D变换测试系统以填补国内空白。文中介绍其工作原理,以及三种动态特性表征方法——直方图法、等效位数法以及谱分析法。文末还讨论了测试系统研制中的一些关键技术。
This paper describes the general principle of test method for measuring the dynamic performance of high-speed A/D converter. This dynamic performance can be characterized by the following three methods——Histogram method, Effective bits methods, and Spectrum analysis. Then an automated test system is proposed and the parameters that characterize the dynamic performance of the ADC are derived.
出处
《宇航计测技术》
CSCD
北大核心
1990年第5期66-72,共7页
Journal of Astronautic Metrology and Measurement
关键词
A/D变换
动态特性
测试系统
Analog—digital conversion, Dynamic property principle, ^+Testing system.