摘要
研究了万工显光学接触器在测量过程中其测力对测量精度的影响,建立了该项误差的数学模型,并通过实例对误差进行修正,消除了测力所引起的测量误差,提高了万工显的测量精度。
The effect of measuring force of optical contact probe of universal tool maker's microscope on the measurement accuracy is researched and the mathematical model of this error is established.An example to explain how to correct the error is present,Thereby,the measuring errors caused by measuring force has been eliminated,the accuracy is enhanced.
出处
《宇航计测技术》
CSCD
北大核心
1990年第6期18-22,共5页
Journal of Astronautic Metrology and Measurement
关键词
光学接触器
测力
测量精度
Optical contact probe
Measuring force
Bending Measurement error
Error checking