通用Toffoli可逆门的固定故障测试

Fault Testing for Universal Toffoli Reversible Gates

可逆电路技术在低功耗芯片和量子通信中广泛使用。目前,大部分学者着重研究可逆电路的合成,对电路的故障测试却很少问津,但是可逆电路的测试在应用中却十分重要。文中构造了一种四输入通用Toffoli门(universal toffoli gate,UTG)用来检测电路故障,这个门可以实现所有基本的布尔逻辑。UTG门可以检测到所有的单一固定故障并且能够获得一个最小测试向量集。使用该文提出的UTG门可实现所有复杂的可逆电路并且能够测试所有单一固定故障。实验结果表明,与其他测试方法相比,使用UTG门的量子消耗和测试向量都是之和是最小的。

Techniques of reversible circuits can be used in low-power microchips and quantum communications.Current most works focuses on synthesis of reversible circuits but seldom for fault testing which is sure to be an important step in any robust implementation.In this paper,we propose a universal Toffoli gate（UTG） with four inputs which can realize all basic Boolean functions.The all single stuck-at faults are analyzed and a test-set with minimum test vectors is given.Using the proposed UTG,it is easy to implement a complex reversible circuit and test all stuck-at faults of the circuit.The experiments show that reversible circuits constructed by the UTGs have less quantum cost and test vectors compared to other works.