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美国GE CT(hispeed NX/i)数据采集系统原理分析及故障判别 被引量:1

Principle analysis and fault diagnosis of American GE CT(hispeed NX/i) data collection system
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摘要 Hispeed NX/i是美国GE公司生产的双排螺旋CT,属大型精密医疗设备,系多学科知识的综合产物,工作原理十分复杂。数据采集系统(DAS)是该设备中的关键部分,其精度、稳定性、可靠性及工作状态直接影响图像的质量。因此,数据采集系统(DAS)的组成及工作原理对使用及维护人员十分重要。文中对美国GE CT(hispeed NX/i)数据采集系统的组成、工作原理进行了分析,并根据其工作特点介绍了该系统中典型故障的判别及"数据测试图形"检测法。依据该判别及检测方法可提高GE CT(hispeed NX/i)数据采集系统故障点的检测速度和准确率。 Hispeed NX/i is a double row helical CT produced by American GE Corporation which is a large-scale precision instrument based on a combination of knowledge from many fields and has very complicated working principle.For this equipment,the data acquisiton system(DAS) is the critical part since its accuracy, stability and reliability will directly affect the image quality.Therefore,the composition and principle of the data acquisiton system(DAS) are very important to the users and maintainers.This paper analyzes the component and principle of the American GE CT(Hispeed NX/i) data acquisiton system.Then it illustrates the diagnosis for some typical faults of the system and the testing method called "Data Testing Graph"based on its operating feature.Based on this diagnosis,both speed and accuracy of the faults detection of GE CT(Hispeed NX/i) data collection system have been improved.
出处 《沈阳师范大学学报(自然科学版)》 CAS 2011年第4期503-505,共3页 Journal of Shenyang Normal University:Natural Science Edition
基金 辽宁省教育厅科学研究资助项目(L2010521)
关键词 CT 数据采集系统 通道 伪影 CT data acquisiton system channel artifact
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