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高g值加速度存储测试装置设计及实现 被引量:3

Design of Stored-test Device for High g Acceleration Measurement
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摘要 针对高速撞击和跌落等环境试验的离线存储测试需求,从设计灵活性出发,基于混合型SOC单片机,设计了一款高g值加速度存储测试装置。通过硬件电路设计及C8051F340单片机的固件程序设计实现了测试数据的采集及存储功能。基于LabVIEW 8.2设计了上位机应用软件实现了测量设置及数据回放及处理功能。经测试验证采集回放波形与激励波形一致。该装置可用于冲击、跌落等离线环境试验测试以及设备校准。 In order to meet the need of off-line storing and testing in the environment experiment of high speed shock and falling off,a kind of stored-test Device for high g acceleration measurement based on the technology of co mmixed SOC single chip MCU were designed. The functions of data acquisition and storage were achieved by the designing of hardware circuit and the C8051 F340' s hardware progra taming. Based on the LabVIEW 8.2. The PC application software was designed to make functions of measure setting and data replay available. The replay waveforms are verified the same with the source waveform. So this device can be used in the off-line environment experiment of shock and falling , and also in device calibration.
出处 《仪表技术与传感器》 CSCD 北大核心 2011年第11期28-30,33,共4页 Instrument Technique and Sensor
关键词 高g值加速度 存储测试装置 C8051F340 LABVIEW high g acceleration stored-test device C8051 F340 LabVIEW
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参考文献3

  • 1TEDD A. Rohwer Miniature, singile channel, memory-based, high g acceleration recorder. Sandia national laboratories, SAN099-1392C.
  • 2BAKER B.嵌入式系统中的模拟设计.李喻奎译.北京:北京航空航天大学出版社.2006.
  • 3C8051F单片机应用解析.潘琢金,孙德龙,夏秀峰,译.北京:北京航空航天大学出版社,2002

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