环境温度补偿的红外焦平面阵列非均匀性校正

Surrounding temperature compensation for infrared focal plane arrays non-uniformity correction

由于非制冷红外焦平面阵列的非均匀性随使用环境温度的变化漂移,校正参数需要经常更新。针对非制冷红外焦平面阵列非均匀这一特点和定标校正的不足,应用红外焦平面阵列二元非线性的非均匀性理论模型,提出了环境温度补偿的非均匀性校正,该方法既考虑了在大动态范围目标温度探测器响应的非线性,又考虑了使用环境温度变化对非均匀性的影响,从而进行了目标辐射温度非线性非均匀校正和对环境温度漂移的补偿,详细介绍了该校正技术的实施程序。比较了几种校正方法的校正效果,定量测试结果表明,该方法可达到0.017%的校正后残留非均匀性,提高了校正精度;实时成像显示,该校正技术改善了红外成像的图像质量,扩大了校正技术的适用范围。

Due to the non-uniformity of uncooled infrared focal plane arrays（IRFPA） shifting along with the variation of the application surrounding temperature,correction parameter must be updated frequently otherwise the correction quality would be degraded.Based on binary nonlinear non-uniformity theory model,a novel non-uniformity correction method considering surrounding temperature compensation was proposed.The implement procedure was described in detail.This approach takes into account both the responsive nonlinearity under the large dynamic range and the influence of surrounding temperature changes for non-uniformity.Quantitative test and comparison were performed among several correction technologies.Experimental test results show that the remainder non-uniformity corrected by proposal algorithm is less than 0.017%.This technique reduces the correction error largely.Real-time imaging indicates this method improve the image quality clearly.Furthermore,extends the application range of non-uniformity correction technology.