期刊文献+

铜、镍对无铅焊点界面反应的影响

Influence of copper and nickel on interfacial reaction of lead free joints
下载PDF
导出
摘要 界面反应对焊点性能和可靠性有重要影响。以目前引起广泛关注的Sn-Ag-Cu及Sn-Cu系无铅钎料为对象,分别讨论了Cu,Ni二种元素对无铅焊点界面反应的影响,分析了界面金属间化合物(IMC)的类型,形貌及物理性能的演变规律。在钎料中Cu含量的变化会影响钎料对基板的熔蚀能力,同时也能够改变IMC的类型,进而促进IMC发生大规模剥离现象。加人到钎料或铜基板中的微量Ni都可以改变IMC厚度及IMC的稳定性。 The interfacial reaction is proven to have a significant effect on the properties and reliabilities of joints.The Sn—Ag-Cu and SnCu solders attracted wide attention at present were used as research objects in.And the effects of copper and nickel on the interfacial reaction of lead free soldered joints were studied,respectively.The types and morphology of the intermetallic compounds(IMC) as well as their physical properties were also analyzed.The variation of copper content in solders can change the dissolution of substrates and the types of the IMC, and then cause the massive spalling.Trace amount of nickel in solders or copper substrate can change the thickness and the stability of the IMC.
作者 周飞 薛松柏
出处 《焊接》 北大核心 2011年第12期15-18,70,共4页 Welding & Joining
关键词 无铅钎料 铜镍 界面反应 金属间化合物 lead free solders copper nickel interfacial reaction intermetallic compounds
  • 相关文献

参考文献17

  • 1Laurila T, Vuorinen V. Combined thermodynamic kinetic analysis of the intcrfacial reactions between Ni metallization and various lead - free solders [ J ]. Materials, 2009, 2 (4) : 1796 - 1834.
  • 2Ho C E, Tsai R Y, Lin Y L, et al. Effect of Cu concentration on the reaction between Sn - Ag - Cu solders and Ni [ J ]. Journal of Electronic Materials, 2002, 31(6) : 584 -590.
  • 3Yu H, Vuorinen V, Kivilahti J K. Solder/Substrate interfacial reactions in the Sn- Cu- Ni interconneetion system[ J]. Journal of Electronic Materials, 2007, 36(2) : 136 -146.
  • 4Ho C E, Yang S C, Kao C R. Interracial reaction issues for lead- free electronic solders [ J]. Journal of Materials Sciende : Materials in Electronics, 2007, 18 ( 1 - 3) : 155 - 174.
  • 5Chen W M, Yang S C, Tsai M H, et al. Uncovering the driving force for massive spalling in the Sn - Cu/Ni system [ J]. Journal of Scripta Materialia, 2010, 63( 1 ), 47 -49.
  • 6Chang C C, Kao C R. Effects of Cu content on the dissolution rate of Cu for real solder joint during refiow soldering[ C ]. The 4th International Microsystems, Packaging, As sembly and Cir- cuits Technology Conference, Taibei, PRC, 2009, 44-47.
  • 7Ha J S, Oh T S, Tu K N. Effect of supersaturation of Cu on reaction and intermetallic compound formation between Sn - Cu solder and thin film metallization[ J ]. Journal of Materi- als Research, 2003, 18(9): 2109-2114.
  • 8Alam M O, Chan Y C, Tu K N. Effect of 0.5wt% Cu addition in Sn - 3.5% Ag solder on the dissolution rate of Cu metallization [ J ]. Journal of Apphed Physics, 2003, 94 (12) : 7904-7909.
  • 9Korhonen T M, Su P, Hong S J, et al. Reactions of lead - free solders with CuNi metallizations [ J ]. Journal of Electronic Materials, 2000, 29(10): 1194- 1199.
  • 10Vuorinen V, Yu H, Laurila T, et al. Formation of intermetallic compounds between liquid Sn and various CuNiX metal- lizations [ J ]. Journal of Electronic Materials, 2008, 37 (6) : 792 - 805.

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部