嵌入式系统中存储器性能研究

Performance of DRAM in embedded system

动态随机存储器是嵌入式系统的一个重要组成部分,而动态随机存储器故障是嵌入式系统故障的一个主要原因之一。在此从动态随机存储器的结构和失效模型出发,有针对地提出了用于检测性能的数据和读写方式,实验证明通过提出的检测方法能够有效地找出潜在的存储器故障,从而能够为嵌入式系统设计人员提供改善系统性能的方法和途径。

The dynamic random access memory （DRAM） is the important part of an embedded system, but its fault is the main reason that-causes the malfunction of the embedded system. Proceeding from the DRAM structure and the failure model, the data patterns and read--write mode are proposed to test the performance of DRAM in embedded system. The experiments show that these approaches proposed in this paper can effectively detect the potential defects of DRAM, and provide a method or a way for the designers of the embedded system to improve the system performance.