专利计量指标研究进展及层次分析

A Study on Development of Patent Indicators and Their Structure

有效地利用专利计量指标可以挖掘专利数据中大量有价值的技术与法律信息。遗憾的是目前专利计量指标在我国的运用并不十分理想。本文在对专利计量指标相关研究进行全面梳理的基础上,分析当前专利计量指标研究中存在的主要问题与不足;根据专利文献的内在特性,将现有的专利计量指标划分为数量、质量、科技和速度4个层次。厘清专利计量指标的层次可以引导我们正确、有效的选择和使用相关指标,使专利信息更好地为企业技术创新服务。

At present, the value of patent information has been recognized by more and more people. But the use of patent indicator is still not very good in China because there isn＇ t a comprehensive understanding of these indicators. This paper studies the patent in- dicators on the basis of a comprehensive analysis, and the author divides the patent indicators into four levels according the features of patent, these are patent quantity indicators, patent quality indicators, patent science and technology indicators and patent speed indica- tors. This clarification can help us to choose the correct and effective indicators according our target when the author make the patent information analysis.