期刊文献+

High breakdown voltage InGaAs/InP double heterojunction bipolar transistors with f_(max)=256 GHz and BV_(CEO)= 8.3 V 被引量:3

High breakdown voltage InGaAs/InP double heterojunction bipolar transistors with f_(max)=256 GHz and BV_(CEO)= 8.3 V
原文传递
导出
摘要 An InGaAs/InP DHBT with an InGaAsP composite collector is designed and fabricated using triple mesa structural and planarization technology. All processes are on 3-inch wafers. The DHBT with an emitter area of 1×15 μm2 exhibits a current cutoff frequency ft = 170 GHz and a maximum oscillation frequency fmax = 256 GHz. The breakdown voltage is 8.3 V, which is to our knowledge the highest BVcEo ever reported for InGaAs/InP DHBTs in China with comparable high frequency performances. The high speed InGaAs/InP DHBTs with high breakdown voltage are promising for voltage-controlled oscillator and mixer applications at W band or even higher frequencies. An InGaAs/InP DHBT with an InGaAsP composite collector is designed and fabricated using triple mesa structural and planarization technology. All processes are on 3-inch wafers. The DHBT with an emitter area of 1×15 μm2 exhibits a current cutoff frequency ft = 170 GHz and a maximum oscillation frequency fmax = 256 GHz. The breakdown voltage is 8.3 V, which is to our knowledge the highest BVcEo ever reported for InGaAs/InP DHBTs in China with comparable high frequency performances. The high speed InGaAs/InP DHBTs with high breakdown voltage are promising for voltage-controlled oscillator and mixer applications at W band or even higher frequencies.
作者 程伟 赵岩 高汉超 陈辰 杨乃彬 Cheng Wei;Zhao Yan;Gao Hanchao;Chen Chen;Yang Naibin(Science and Technology on Monolithic Integrated Circuits and Modules Laboratory Nanjing Electronic Devices Institute,Nanjing 210016,China)
出处 《Journal of Semiconductors》 EI CAS CSCD 2012年第1期56-58,共3页 半导体学报(英文版)
关键词 INP double heterojunction bipolar transistor PLANARIZATION InP double heterojunction bipolar transistor planarization
  • 相关文献

参考文献3

二级参考文献31

  • 1Hafez W, Snodgrass W and Feng M 2005 Appl. Phys. Lett. 87 252109
  • 2Su S, Liu X, Xu A et al 2006 Chin. J. Semiconduct. 27 792
  • 3Dahlstrom M 2003 PhD Thesis (University of California, Santa Barbara, USA)
  • 4Jin Z and Liu X 2008 Sci. Chin. E 51 (accepted)
  • 5Jin Z, Prost W, Neumann S and Tegude F J 2004 Appl. Phys. Lett. 84 2910
  • 6Rodwell M J W, Urteaga M, Mathew T et al 2001 IEEE Trans. Electron. Devices 48 2606
  • 7Liu W 1998 Handbook of Ⅲ-Ⅴ Heterojunction Bipolar Transistors (New York: Wiley-Interscience) p 722
  • 8Kirk C T Jr 1962 IRE Trans. Electron. Devices 9 164
  • 9Hafez W, Snodgrass W, Feng M 2005 Appl. Phys. Lett. 87 252109
  • 10Lee Q, Martin S C, Mensa D, Smith R P, Guthrie J and Rodwell M J W 1999 IEEE Electron Device Lett. 20 396

共引文献12

同被引文献4

引证文献3

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部