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酸性CuCl_2蚀刻液动态蚀刻均匀性与蚀刻速率研究 被引量:7

Dynamic acid CuCl_2 etching uniformity and etching rate study
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摘要 对酸性CuCl2蚀刻液在HCl/H2O2和HCl/NH4Cl两种体系下进行了水平动态蚀刻研究,分别对蚀刻均匀性和蚀刻速率进行了分析,结果表明面铜粗糙度和上下喷淋对蚀刻均匀性有很大影响,HCl/NH4Cl系统相对于HCl/H2O2系统具有更高的蚀刻速率,为工业生产提供相关的数据参考。 In this article,a dynamic etching of acid CuCl2 etching bath under the two systems of HCl/H2O2 and HCl/NH4Cl has been studied,the uniformity of etching and the etching rate has been respectively analyzed.The results show that the roughness of surface copper and the upper and the lower spray both influence on etching uniformity greatly,HCl/NH4Cl system has a higher etching rate relative to the HCl/H2O2 system and the relevant reference data has been provided for industrial production.
出处 《印制电路信息》 2012年第2期38-41,共4页 Printed Circuit Information
关键词 酸性CuCl2蚀刻液 再生剂 蚀刻均匀性 蚀刻速率 acid CuCl2 etching bath regeneration etching uniformity etching rate
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  • 1魏静,罗韦因,徐金来,罗海兵.印刷线路板精细蚀刻的影响因素[J].表面技术,2005,34(2):49-50. 被引量:18
  • 2西安航空发动机公司.一种快速腐蚀印刷线路板的方法:CN,89103517.6[P].1990-12-12.
  • 3林金堵 龚永林编.现代印刷电路基础[Z].,.145-146.
  • 4Dietz K., H., Dry Film Photoresist Processing Technology, Electrocemical Publicationsltd. USA, 2001, pp.1-28, 65-112
  • 5Chiniwalla P., Manepalli R., Fransworth K., Batman M., Dusch B., Kohl P., Bildstrup-Allen S., A., Multilayer Planarization of Polymer Dielectrics, IEEE, Transactions on Advanced Packaging, Vol. 24. No. 1, 2001, pp.41-53
  • 6Omiya M., Kishimoto K., Inoue H., Amagai M,. Measurment of copper thin film adhesion by multi-stages peel test. CPMT, Taiwan, 2002, pp.472-477
  • 7Herrman G., Eegerer K.,A., Handbook of Printed Circuit Technology. EPL, 1992
  • 8Jalonen P., Tuominen A., The effect of core material surface roughness on line accuracy using electrodeposited photoresist. EMAP, Hong Kong, 2000, pp. 156-159
  • 9Liu F., Sundram V., White G., Tummala R., R., Ultra-fine photoresist image formation for next generation high-density PWB substrates, The International Journal of Microcircuits an Electronic Packaging, Vol. 23, No 3, 2000, pp.339-344
  • 10http://www.epa.gov/dfe/pubs/pwb

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