基于函数切片的嵌入式软件回归测试研究

Study of Embedded Software Regression Test Based on Function Slice

为提高中大型嵌入式软件回归测试的效率,克服因程序微小变动而导致对整个嵌入式软件系统重新测试的弊端,提出一种函数切片算法Function Slice。给出代码影响域的概念,采用函数切片思想对待回归测试用例集进行约简,选取和源代码变化相关的测试用例进行回归测试。实验结果表明,该算法能约简嵌入式软件中的待回归测试用例集,提高回归测试效率,且适用于较复杂的嵌入式系统回归测试过程。

In order to improve the performance of regression test for large software and overcome the disadvantages of the entire retest of embedded software system because of the small changes in the source code,this paper presents FunctionSlice.It gives the conception of function slice.It reduces the regression test suites by slice ideas,selecting the test suite which is associated with source code changes for regression test.Experimental results show the algorithm substantially reduces the embedded software regression test suite and improves the efficiency of regression test.It is easy to be used on more complex embedded systems for the regression test process,and has great practicality.