期刊文献+

利用AFM机械刻划的切屑形成试验 被引量:1

Study of Nano-mechanical Characterization of Chip Formation Using Atomic Force Microscopy
下载PDF
导出
摘要 切屑的形成和对切屑产生影响的因素是机械加工中的一项重要研究内容。基于原子力显微镜AFM的机械刻划加工方法,对超精密加工中切屑的形成、形貌的影响因素的研究具有重要意义。通过阐述原子力显微镜的工作原理及针尖刻划过程,应用纳米压痕理论对基于AFM的机械刻划加工机理、切屑形成过程进行分析。随后通过变化不同参数如进给量、刻划速度、垂直载荷和不同进给方向等进行刻划试验,通过扫描电镜对刻划后试件形成切屑进行观察。通过实验结果,分析各种参数对切屑的形成、形貌的影响和变化规律。 Research on chip formation and its influencing factors is an important contents in the field of mechanical machining research.The method of mechanical characterization based on AFM has the vital significance for the study of the form of ultra-precision processing chip,and the influencing factors of the morphology.Through the elaboration of atomic force microscope's principle and the tip skinned process,it has analyed the theory of mechanical characterrization processing based on AFM and the scraps forming process,using application of nano creasing theory.Whereafter,the experiment research on scratching with different parameters,such as feed rate,scratching speed,vertical load and feed direction,is carried to analyze their influence on chip formation and its morphological characteristics.We can analy the effeacts of the mechanism and morphology by the change rule.
作者 赵菲菲
出处 《中国农机化》 北大核心 2012年第1期185-188,共4页 Chinese Agricul Tural Mechanization
关键词 原子力显微镜 机械刻划加工 切屑 atomic force microscope nano-scratch chip
  • 相关文献

参考文献4

二级参考文献23

  • 1[2]薜增泉.纳米科技探索[M].北京:清华大学出版社, 2002.
  • 2吕文哲.用VisualC++开发Windows环境下串行通信程序[J].电子技术应用,1997,23(8):29-31. 被引量:10
  • 3Mamin H J, Fan L S, Hoen S, et al. Tip-based data storage using micromechanical cantilevers[J]. Sensors and Actuators A, 1995, 48: 215-219.
  • 4Chasiotis I, Knauss W G. A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy [J]. Experimental mechanics, 2002, 42 (1): 51- 57.
  • 5Dedkov G V. Nanotribology: experimental facts and theoretical models[J]. Physics-Uspekhi, 2000, 43(6): 541-572.
  • 6Hutter J L, Bechhoefer J. Calibration of atomic-force microscope tips[J]. Rev. Sci. Instrum, 1993, 64(7): 1868-1873.
  • 7Carpick R W, Ogletree D F, Salmeron M. Lateral stiffness: a new nanomechanical measurement for the determination of shear strengths with friction force microscopy[J]. Appl. Phys. Lett, 1997, 70(12): 1548-1550.
  • 8Cumpson P J, Hedley J, Zbdan P. Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration[J]. Nanotechnology, 2003, 14: 918-924.
  • 9Gibson C T, Johnson D J, Anderson C, et al. Method to determine the spring constant of atomic force microscope cantilevers[J]. Rev. Sci. Instrum, 2004, 75(2): 565-567.
  • 10Neumeister J M. Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers[J]. Rev.Sci. Instrum. , 1994, 65(8): 2527-2531.

共引文献25

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部