界面层厚度及其影响因素的离散元研究

DEM Research on Thickness and Influence Factor of Interface Layer

采用可以模拟接触面粗糙度的PFC直剪模型,对不同接触面粗糙度和颗粒半径进行了数值模拟,通过追踪接触面附近每一个颗粒的位移变化,分析了界面层的厚度及其影响因素。结果表明:界面层厚度与接触面和颗粒本身的性质密切相关,表征接触面粗糙度的峰谷距和坡角越大,界面层的厚度越大,颗粒平均半径越小,剪切时的界面层厚度也越大。

A series of numerical soil-structure shear tests were performed by Particle Flow Code（PFC） in two dimensions,the effect of the roughness of the interface and the particle radius on the thickness of the interface layer were studied.It is shown that the roughness of interface and the particle radius affect the thickness of interface layer significantly;the thickness of interface layer increases with the decrease of the particle radius as well as the increase of the roughness of the interface.