系列截面法层间距对晶粒体积和表面积测量的影响规律

Influence of serial section thickness on the measurementprecision of 3D grain volume and surfacearea

系列截面分析方法是显微组织3D定量表征及3D重建的重要方法,为兼顾结果的准确性和效率,系列截面法中层间距的选取非常重要。本文选取不同仿真尺度(300×300×300和400×400×400)的Potts模型Monte Carlo仿真晶粒组织为研究对象,研究了系列截面层间距对三维个体晶粒的体积和表面积测量结果的影响规律,结果表明:系列截面的间距值h<0.111珋l和h<0.135珋l(珋l为晶粒平均截线长度)时,分别可保证晶粒的体积和表面积测量的相对误差小于5%和10%。

To seek for the balance between the efficiency and accuracy of three-dimensional （3D） quantitative characterization of grain structures, the selection of section thickness in serial sectioning technique is of great importance. Taking the grain structures generated by Potts model Monte Carlo simulation as the study object, the aim of this paper was to investigate the influence of serial section thickness （h） on the measurement of grain volume and grain surface area. Let i be the average grai intecept tength, the results indicate that hi1 should be less than 0. 111 for the measurement of grain volume and 0. 135 for that of grain surface area, the relative error of the measurement is less than 5% and 10% , respectively.