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智能双折射率测量系统的研究与改进 被引量:1

Research & Improvement of the Intelligent Birefringence Measurement System
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摘要 针对SZY-1型双折射率测试仪存在的非自动化,系统老化引起的测量精度低等问题,结合电路模块化和程控技术,对原有测试系统的信号发生源和直流高压源部分进行了改造。硬件电路围绕STC89C52搭建,由单片机产生方波信号,并用按键控制其相位、占空比的大小,实时显示波形和数值,取代了原有硬件电路实现相位粗调和细调的方法。阐述了系统的软件设计流程,并对改造后的电路进行了测试,发现测量系统完全符合原电路原理,性能良好,具有较好的应用前景。 Aiming at the problems of non-automation and low accuracy caused by system aging,etc.existed in Type SZY-1 birefringence measurment system,combining with circuit modularization and program control technology,the signal source along with the DC high voltage source parts of the original system.The hardware circuit is built up based on STC89C52RC,square wave signal is generated via a single-chip computer,the phase and the size of the duty ratio of the signal are controlled with keys,and the waveform and value of the signal are real time displayed,thus the original coarse adjustment and fine adjustment method for phase is replaced.In this paper the design process of the system software is described,and the reformed circuit is tested.It is found that the measurement system fully corresponds with the original circuit principle,works well and will have a good prospect in application.
出处 《电子技术(上海)》 2012年第2期37-40,共4页 Electronic Technology
关键词 双折射率测试仪 STC89C52 键控 高压直流电源 移相选频 birefringence teste STC89C52RC keying high voltage DC power supply frequency selection and phase shifting
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