因子分析在X射线荧光光谱重叠谱峰识别中的应用

Application of Factor Analysis to Identification of Overlapped Spectrum in XRF

用渐进因子分析 (EFA)方法处理合金样品的X射线荧光扫描谱数据 ,按照数学原理选取扫描步长 ,根据XRF特性选择合适的训练集建立数学模型 ,可以准确判断谱峰重叠 ,该方法在合理取点和组分含量相当的情况下有良好的识别能力。

EFA method has been used in the processing of qualitative XRF data for metal alloys.With mathematically selected scanning steps and a mathematical model based on suitable trainning set selection,the method can correctlly identify spectrum overlaps.Studies reveal that identification ability can be affected by the number of data points and the concentrations of the overlapping elements.