连续偏光干涉法测量波片宽波段延迟量变化

Measurement of wide-band phase retardation variation of wave-plates by means of continuous polarization interference method

为了测量石英波片宽光谱下相位延迟量,根据连续偏光干涉原理,提出了一种新的测量方法,并给出了相应波长的延迟量数据处理办法。采用岛津UV-3101PC分光光度计双光路比对测量方法,增加了采集数据的稳定可靠性,获得了已知厚度的石英波片300nm～800nm波段的连续偏光干涉谱,进行了理论分析和实验验证,获得了波片的宽光谱相位延迟量数据。结果表明,实验曲线和理论曲线吻合较好,测量平均误差不大于2°。这一结果对研究波片延迟量色散性质以及工艺进程的引导有重要实际意义。

In order to measure the wide-band phase retardation variation of quartz wave-plates, a new method was proposed based on the principle of continuous polarization interference, and the data processing method for the corresponding retardation variation of each wavelength was given. In the method, relative measurement was carried out with the Shimadzu UV-3101PC spectrophotometer to increase the stable reliability of the data collection, and the continuous polarization interference spectrum of the quartz wave-plate in known thickness at 300nm ~ 800nm wave band was obtained. Then theoretical analysis and experimental verification were carried out. The results show that the experimental curve and theoretical curve fit well, and the measurement of the average error is less than 2~. It has important practical significance for study on the retardation dispersion properties of the wave-plates and the guidance of the technical process.