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纯Bi_(12)SiO_(20)晶体光激发截面的测量

The measurement on photo-ionization cross section of pure Bi_(12)SiO_(20) crystal
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摘要 本文用瞬态光电流方法测量了纯Bi1 2 SiO2 0 (BSO)晶体的光激发截面。当脉冲宽度为 7ns、光强为1 35KW/cm2 、波长为 532纳米的脉冲激光照射BSO晶体时 ,得到瞬态光电流的上升时间为 55微秒 ,可计算出BSO晶体的光激发截面S =5 0 4× 1 0 - 2 0 cm2 。利用光激发截面的数值可得出施主浓度ND=3 2× 1 0 1 9cm- 3。 The photo-ionization cross section of the photorefractive Bi 12 SiO 20 (BSO)crystal was measured by the transient state photocurrent method.When the BSO crystal is illuminated by a 532 nm pulsed laser beam with 7 ns duration and laser power 135 KW/cm 2,the rise time constant of the transient photocurrent is 55μs.The photo-ionization cross section is S=5.04×10 -20 cm 2.
作者 梁其民
出处 《山东轻工业学院学报(自然科学版)》 CAS 2000年第1期48-51,共4页 Journal of Shandong Polytechnic University
关键词 光激发截面 Bi12SiO20晶体 瞬态光电流 测量 photo-ionization cross section Bi 12 SiO 20 Crystal transient state photocurrent
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参考文献11

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