XPS定量法研究Al-Zn-In牺牲阳极表面组成

A QUANTITATIVE XPS METHOD STUDY ON AlZn-In SACRIFICIAL ANODE SURFACE

利用计算机辅助系统,采用 XPS 定量分析方法-原子灵敏度因子法(ASF),结合氩离子刻蚀技术,定量研究了 Al-Zn-In 牲牲阳极在3％NaCl 溶液中恒电流密度放电前后的表面组成。实验表明:(1)在恒电流密度放电下,合金元素 Zn 和 In 以“溶解-再沉积”的活化机理富集在牺牲阳极基体表面的氧化膜中,形成金属 Zn 和 In 的再沉积相。(2)金属 Zn 和 In 的富集量随放电电流密度的增大而增多。(3)金属 Zn 和 In 在表面富集的深度差别,使二者对牺牲阳极活化溶解的影响不尽相同。根据以上结果,提出了 Al-Zn-In 牺牲阳极在3％NaCl 溶液中放电后表面组成的物理模型。

The surface composition of Al-Zn-In sacrificial anode which had been galvanostaticly discharged in 3%-NaCl aqueous solution,was studied by quantitative XPS method,combined with Ar^+ ion etching. The results showed that: 1.During galvanostatic discharging in 3%-NaCl solution,alloy elements Zn and In enriched in the surface oxidized film in accordance with dissolution-redeposition mechanism,then formed Zn and In enric- hed phases. 2.The quantity of Zn and In enrichment on anode surface was controlled by discharge conditions. 3.Zn and In can affect the active dissolution to different degrees due to their different enrichment depthes. According to these resales,an enrichment model of Al-Zn-In anode surface was proposed.