高速SerDes抖动成因及其测试方法分析

Analyse of the Cause of SerDes Jitter and Testing Methods

高速SerDes(SERializer/DESerializer)设备在高速芯片I/O接口互联上已经占有统治性地位。然而随着串行链路速率不断提高,随之而来的抖动等因素对高速SerDes成品率构成极大威胁。本文首先对SerDes的结构进行介绍,然后对高速SerDes中信号抖动进行定性分析,最后提出了几种重要的SerDes测试方法,对高速Serdes的测试具有一定参考价值。

SerDes（High-Speed Serializer/Deserializer） devices have occupied the dominant position of interconnection of High-Speed chip I/O interface.As it is getting faster, which has exceeded 10Gbps at present,The factor of jitter severity has maken a great threaten to the yield of SerDes product.As high_speed SerDes,the deep analysis of the source of jitter and choosing the fine testing methods,is absolutely necessary to insure the success of high_speed SerDes design.This paper firstly introduces the structure of SerDes,then analyses the source of jitter, and lastly brings some testing methods for tesing method,which has reference value for High-Speed SerDes.