QCA电路的缺陷研究

Study of Defects in QCA Circuits

针对量子元胞自动机电路中出现的元胞移位等元胞缺陷,介绍了基于QCADesigner的元胞缺陷分析,得出了特定结构的容错范围。对于制造过程出现的单电子故障,分析了不同输入时单电子故障对传输线和反相器的影响。对于制造过程中出现的漂移电荷缺陷,分析了这些缺陷对传输线的影响。通过改变元胞与传输线之间的距离,研究了QCA传输线之间的串扰问题,得出了其容错范围。最后对RS触发器中出现的元胞缺陷采用测试序列进行了分析研究,从而为进一步研究QCA电路的缺陷提供了依据和方向。

According to the cell defects such as the cell displacement in the quantum cellular automata （QCA） circuit, the cell defects analysis based on QCADesigner was introduced, and the faulttolerance range of a certain structure was obtained. The effects of the single electron fault arising in the manufacturing process on the wires and inverters at the different inputs were analyzed. For the defect of drift charge generated in the manufacturing process, the effects of the de- fects on the wire were studied. Through changing the distance between the cell and the wire, the crosstalk between the wires was researched and the faulttolerance range was obtained. Finally, the cell defects in the RS flip-flop were studied using the test sequence. Such analysis should be used for the further study of the defects in the QCA circuits.