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Optical transient waveform monitoring based on cross-gain modulation in semiconductor optical amplifier

Optical transient waveform monitoring based on cross-gain modulation in semiconductor optical amplifier
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摘要 An all-optical transient waveform equivalent time sampling system based on cross-gain modulation (XGM) in semiconductor optical amplifier (SOA) is presented. Anoisy SOA dynamic model and PIN equyalent circuit function are employed for system evaluating. The results show this SOA-XGM sampler with subtracting postprocessing can achieve picosecond sampling window. The shape of sampling window can be adjusted by SOA bias current and amplitude of control pulse. Compared with amplified spontaneous emission (ASE) noise of SOA and thermal noise in PIN, the jitter of sampling control pulse causes most sampling error. Simulations show that this SOA-XGM sampler can be a capable candidate for transient waveform sampling.
出处 《Optoelectronics Letters》 EI 2012年第1期40-42,共3页 光电子快报(英文版)
基金 supported by the National Natural Science Foundation of China(No.61077068) the Science and Technology Commission of Shanghai Municipality(STCSM)(No.08DZ2231100)
关键词 Magnetic materials Optoelectronic devices 半导体光放大器 交叉增益调制 波形 瞬态 采样系统 监测 光学 放大自发辐射
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