大分子自组装功能膜的结构及界面层表征

Methods for Characterizing the Properties of Self-Assembled Films

介绍了四种常用分析方法在自组装功能膜结构及其界面层表征中的新进展。红外光谱是常用的结构分析方法,运用掠角反射红外光谱及衰减全反射红外光谱可以分析自组装薄膜表面、界面结构以及分子链段的取向;XPS分析可以确定薄膜的化学组成;电镜的运用使直接观察体系的形态、形貌成为可能;ESR是研究聚合物在溶液中自组装成胶束过程的有力工具。

Appbcation of four analytica methods for research on self-assembled systems are persented here. IR is a common way of obtaining the structural information and orientation of polymer chains. Using the XPS,the composition of self-assembled films and the binding energy can be determined. TEM.SFM and AFM give the surfacial topography of SA films directly. We can get the informaton about structure of aggregates and dynamics of self-assembling polymers.