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0402片式网络电阻“曼哈顿”现象的分析与改善

Analysis and improvement of Manhattan symptom on 0402 chip network resistors
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摘要 针对0402片式网络电阻的"曼哈顿"问题,介绍了"曼哈顿"现象的成因以及主要影响因素,并结合实际生产所遇到0402片式网络电阻的"曼哈顿"问题,从研发及生产工艺方面提出相应的改善和预防措施;在研发阶段,通过修改0402片式网络电阻的焊盘尺寸,在生产阶段通过进一步规范作业要求,使得产品的故障率由0.44%下降到0.04%。 In view of Manhattan symptom on 0402 chip network resistors,the cause of Manhatton phenomenon and main factors were introduced systematically.Combining with production practice,some improving and preventive actions were introduced both RD work and manufacturring process to resolve the Manhattan phenomenon of 0402 chip network resistors.In the development stages,the footprint dimension of 0402 chip network resistors were modified;work requirements in the production processing were standarded;the failure rate of product decreased from 0.44% to 0.04%.
出处 《桂林电子科技大学学报》 2012年第1期45-48,共4页 Journal of Guilin University of Electronic Technology
关键词 0402片式网络电阻 “曼哈顿”现象 表面张力 改善措施 0402 chip network resistor Manhattan symptom surface tension improvement action
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