光谱法测定钛及钛合金中的微量杂质元素

Spectral Determination of Trace Impurity Elements in Ti and Its Alloys

采用发射光谱分析技术,研究了钛及钛合金中Zr,Ru,Pd,Hf,Cu,Y,V,Mo,Nb,Al,Co,Ni,Ta,Bi,Sn,Cr,Mn的光谱测定方法。结果表明,选用碳粉作为缓冲剂,使用浅孔电极和大电流激发,一次摄谱可同时测定17个杂质元素。测定下限为3×10-4%～15×10-3%,相对偏差在15%以内。

The determination of Zr, Ru, Pd, Hf, Cu, Y, V, Mo, Nb, Al, Co, Ni, Ta, Bi, Sn, Cr and Mn in Ti and its alloys have been studied using an atomic emisson spectrum spectroscopy. The results show that seventeen trace impurity elements can be determined simultaneously under the conditions of the carbon powder buffer, an electrode with shallow hole and high exciting currint. The lower limit of the determination is in the range 3×10 -4 %~1 5×10 -3 %, with a relative standard deviation of less than 15%.