摘要
采用溶胶-凝胶法制备锆钛酸铅95/5(PZT95/5)薄膜,通过分析介电温度谱、介电频谱研究薄膜的介电性能.研究结果表明:介电常数-温度曲线ε(T)的相变峰随着频率的增加而逐渐变得平坦.同时,介电常数倒数与温度曲线ε-1(T)在高频不符合居里外斯定律;采用普适弛豫定律公式,对不同温度下的介电频谱曲线ε(f)进行拟合,得到弥散系数随着温度的变化曲线,该曲线在铁电-顺电转变以及反铁电-铁电转变这两个特征温度附近出现异常,结合材料反铁电-铁电-顺电相变的微观结构变化规律对此现象进行了讨论.
The dielectric properties on PZT95/5 films by Sol-Gel process was studied by means of dielectric spectrums for temperature and frequency,respectively.The results showed that the transition peak of ε（T） curve got broad and flat with increasing frequency and the ε-1（T） curve at high frequency didn＇t obey the Curie-Weiss law.The ε-1（f）curves with different temperatures were fitted by the universal relaxation law,and the exponent n（T） curve was obtained.In this curve,there were abnormal points near the two characteristic temperatures of FE-PE and AFE-FE transition,which was discussed combining the change in microstucture with the AFE-FE-FE transition process.
出处
《武汉工程大学学报》
CAS
2012年第3期42-44,50,共4页
Journal of Wuhan Institute of Technology
基金
天津市高等学校科学发展基金资助项目(20041022)
天津师范大学博士基金资助项目(5RL019)
天津师范大学与上海天泰茶业科技有限公司开发项目(53H10059)
