U-Ta合金中Ta含量的EDXRF法测定

Determination of Ta Content in U-Ta Alloy by EDXRF

介绍了用能量色散X射线荧光光谱(EDXRF)法测定U-Ta合金中Ta含量的分析方法。该方法将样品溶解,加载于滤纸片上,制成滤纸试样片,用X射线荧光光谱仪测定试样片中Ta含量。该方法简便、快速、准确,适用于Ta含量在1%～6%范围的U-Ta合金样品的Ta含量测定。对Ta含量为1.5%的样品,测量结果的相对标准偏差(n=6)不大于0.6%;Ta含量为5%的样品,测量结果的相对标准偏差(n=6)不大于0.3%。

A measurement method of Ta contents in U-Ta alloy by energy dispersive X-ray fluorescence （EDXRF） was introduced. Dissolved by acid, coated on filter paper and prepared the filter paper samples, the Ta contents in U-Ta alloy samples were determined by EDXRF. The method is simple, rapid, accurate, and applicable to the determination of Ta content in 1%-6% U-Ta alloy samples. The relative standard deviation （RSD） of this method for the U-Ta alloy sample of 1.5% tantalum content is less than 0.6%, while for the U-Ta alloy sample of 5% tantalum content is less than 0.3%.