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一种抗鸟害水稻变异系颖壳SEM观察及硅含量分析 被引量:9

Observation by Scanning Electron Microscope (SEM) and Analysis of Silicon Content on Glume of Rice Variant Strain with Bird Disaster Resistance
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摘要 抗鸟害水稻材料是一种稀缺的种质资源,研究其稻谷颖壳的表面结构(颖壳稃尖闭合程度,稃毛的长度、直径和密度,颖壳包裹米粒松紧度),以及与颖壳机械强度和韧性相关的硅(Si)元素含量,旨在为抗鸟害水稻新种质的开发利用和理论研究提供依据。利用扫描电镜和能谱技术,观察分析了一种已稳定遗传至第10代的抗鸟害水稻变异品系和3个对照水稻品种稻谷颖壳表面的细胞结构和硅元素含量,结果表明:(1)变异品系颖壳稃尖闭合程度及颖壳的中上部稃毛长度、直径、密度均显著大于对照;(2)对照颖壳与米粒之间的间隙明显大于变异品系;(3)变异品系颖壳外表面的Si含量显著低于对照,而内表面Si含量明显高于对照,内外表面Si含量之差明显低于对照。说明抗鸟害水稻材料的稻谷颖壳表面结构和硅元素含量与普通水稻存在显著差异,为培育抗鸟害水稻新品种提供了有用指标。 Bird-disaster-resistant rice is a kind of scarce germplasm resources, and the research on its glume surface structure, such as the close degree of glume tip, the length, diameter and density of pubescence, as well as the silicon (Si) content related with glume mechanical strength could provide a theoretical basis for the exploitation and utilization of the bird-resistant rice variants. In the present research, the surface structure and silicon (Si) content of glumes of a stably inherited bird-resistant variant of rice (the 10th generation) were investigated via scanning electron microscopy (SEM) and energy spectrum technology. Compared with three control strains, the length, diameter and density of pubescence on the upper middle section of glume as well as the close degree of glume tip were significantly greater for the variant, and the interspaces between glumes and grains were significantly smaller. The variant showed a higher Si content in the outer surface of glume than the three controls, while a lower content in their inner surface. These results indicate that the characteristics of the bird-disaster-resistant variant office are significantly associated with the surface structure and its Si content of glume, and the', results are also useful for developing and utilizing new.
出处 《作物学报》 CAS CSCD 北大核心 2012年第4期725-731,共7页 Acta Agronomica Sinica
基金 国家转基因生物新品种培育重大专项(2008ZX08001-006) 河南省重大科技专项(091100110402-01) 河南省自然科学基金项目(092300410082)
关键词 水稻 颖壳 扫描电镜 能谱 Rice Glume Scanning electron microscopy Energy spectrum Silicon
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