摘要
电子产品的电磁干扰经常在屏蔽暗室进行测量甚至调试,往往带来高昂的费用,而在测量前利用频谱分析仪来进行预测试,可以有效的缩短暗室的调试测量时间,从而降低成本。RIGOL的DSA815频谱分析仪具有准峰值检波和EMI测量功能,用近场探头或天线探测被测设备,可以快捷的对被测设备的电磁干扰情况进行预测试。
The cost of electromagnetic interference test of electronic products is usually rather high becauseit is always measured and debugged in shielded darkroom. While, if the spectrum analyzer is used to makepre-test before the measurement, the debug and measurement time in shielded darkroom can be effectivelyreduced, thus reducing the cost. RIGOL DSA815 spectrum analyzer which is designed with the Quasi-Peakdetector and EMI measurement functions and uses near-field probe or antenna to detect the device undertest, can quickly test the electromagnetic interference of the device under test.
出处
《电子测量技术》
2012年第3期7-10,共4页
Electronic Measurement Technology
