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晶圆划切工艺与优化 被引量:4

Technics and Optimization of Wafer Dicing
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摘要 在研究晶圆划片机划切工艺的基础上,分析了划切的质量缺陷和划切质量评估矩阵,阐述了影响划切质量的诸多因素。介绍了划片刀、承载薄膜、划切模式、划切冷却水的添加剂和划切参数的选择对划切质量的影响,通过对以上5个方面的优化来达到优化工艺的目的,同时还提出了将砂轮划片和微水导激光划片相结合的新划切工艺。 This paper aims to study wafer dicing process of dicing saw,analyzes the quality defects and dicing quality evaluation matrix,described the many factors that affect the quality of dicing,such as dicing blade,mounting tape,dicing mode,cooling water additive and the selection of dicing parameters,the quality of the optimization of the above five aspects to optimize the process,meanwhile proposed a new dicing process of combination dicing saw and micro-water guided laser dicing.
作者 张伟 贾月明
出处 《电子工业专用设备》 2012年第4期7-12,共6页 Equipment for Electronic Products Manufacturing
关键词 晶圆 划切设备 工艺 优化 Wafer Dicing Machine Technics Optimization
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  • 1李莉,乔非,姜桦,吴启迪.半导体生产线动态调度方法研究[J].计算机集成制造系统,2004,10(8):949-954. 被引量:14
  • 2Yongcai WANG Qianchuan ZHAO Dazhong ZHENG.BOTTLENECKS IN PRODUCTION NETWORKS: AN OVERVIEW[J].Journal of Systems Science and Systems Engineering,2005,14(3):347-363. 被引量:2
  • 3张怀,江志斌,郭乘涛.面向瓶颈的半导体晶圆制造系统派工策略及参数优化[J].上海交通大学学报,2007,41(8):1252-1257. 被引量:10
  • 4UZSOY R, LEE C Y, MARTIN-VEGA L A. A review of production planning and scheduling models in the semiconductor industry Part Ⅱ: Shop-floor control [J]. IIE Transactions, 1994,26(5) :44-55.
  • 5LIU Huiran, JIANG Zhibin, FUNG R Y K. The infrastructure of the timed EOPNs based multiple objective real-time scheduling system for 300mm wafer fab[J]. International Journal of Production Research, 2007, 45(21) :5017-5056.
  • 6KNESSL C, TIGER C. Asymptotic approximations and bottleneck analysis in product form queueing networks with large populations [J]. Performance Evaluation, 1998, 33(4):219-248.
  • 7POLLETT P K. Modelling congestion in closed queueing networks [J]. International Transactions in Operations Research, 2000, 7(4/5) :319-330.
  • 8KUO C T, I.IM J T, MEEKOV S M. Bottlenecks in serial production lines:a system-theoretic approach [J]. Mathematical Problems in Engineering, 1996,2(3):2:33-276.
  • 9CHIANG S Y, KUO C T, MEEKOV S M. Bottlenecks in Markovian production lines: a systems approach [J]. IEEE Transactions on Robotics and Automation, 1998, 14 (2) : 352-359.
  • 10CHIANG S Y, KUO C T, MEEKOV S M. C-bottlenecks in serial production lines: identification and application [C]// Proceedings of the 38th IEEE Conference on Decision and Control. Washington, D. C. , USA : IEEE, 1999 :456-461.

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