一种新的小时延测试向量筛选方法

Novel pattern selection method for small-delay faults test

随着集成电路工艺尺寸不断缩小,电路规模不断增大,小时延测试所需的测试向量越来越多,因此小时延测试的成本越来越高。为降低测试成本提出了一种新的小时延测试向量筛选方法。提出的方法用固定型测试向量的组合来检测小时延故障,从组合的测试集中筛选出具有高小时延故障覆盖率的测试向量。最后仅用一个测试集就能同时对固定型故障、跳变故障、小时延故障进行有效的检测,从而大大节省了向量的存储空间。在ISCAS’85和ISCAS’89基准电路上用MinTest测试集进行的实验表明,提出的方法不但有很高的小时延故障覆盖率,而且向量个数的减少最高达到61倍。

With the design of integrated circuits（ICs） scale increasing and the feature size shrinking,small-delay test becomes more difficult and more important.To simplify the small-delay test process and reduce the test cost,the paper proposes a new small-delay pattern selection method which regroups test patterns of stuck-at faults to detect the small-delay faults,and then selects the patterns that can detect effectively small-delay faults.Finally,only by using this optimizing test set,the stuck-at faults,the transition faults and the small-delay faults all can be effectively detected.The experimental results on ISCAS’85 and ISCAS’89 benchmark circuits show that the pattern selection method proposed in this paper can produce a test set of high small-delay faults coverage and reduce test data volume up to 61 times.