摘要
从运算放大器共模抑制比(CMRR)定义开始,对多种仿真和测试方法进行分析和比较,深入论述辅助元器件(如电阻和辅助放大器)对待测器件(DUT)仿真和测试结果的影响,分别总结出适合于仿真和测试的方法,为运算放大器设计过程中的仿真验证和封装后的测试提供参考。
Various methods for simulation and measurement of common-mode rejection ratio(CMRR) of operational amplifiers were analyzed and compared.Effects of external elements,such as resistors and auxiliary amplifiers,on the device-under-test(DUT) were discussed in detail.Finally,methods suitable for simulation and measurement were summarized,respectively,which may provide a reference for simulation during design of operational amplifiers and measurement after packaging.
出处
《微电子学》
CAS
CSCD
北大核心
2012年第2期154-158,共5页
Microelectronics
关键词
运算放大器
共模抑制比
仿真
测试
Operational amplifier
Common-mode rejection ratio(CMRR)
Simulation
Measurement